The Focused Ion Beam (FIB)microscopes are extermely versatile and powerful instruments for materials research. It’s a tool to realize sample imaging, sectioning, ion-lithography and nano/micro machining on surfaces. The art to produce complex shapes at the nanoscales is often limited with the default pattern engine included in the instrument software or you need to buy a very expensive add-in for enlarging the potentiality of your pattern strategy. An alternative way to improve the complexity of your pattern is the ‘stream file’....
- N/A, January 28, 2015 – GioNa 2015 - GIORNATE DI STUDIO SULLE NANOTECNOLOGIE 28-29/01/2015